Use the product documents for more information on the application functions, understand the theory of operation, how to remotely program or operate the application, and do other tasks.

This application help uses the following conventions:

• The term "Application," and "Software" refers to the TekExpress PCI Express application.
• The term “DUT” is an abbreviation for Device Under Test.
• The term “select” is a generic term that applies to the two methods of choosing a screen item (button control, list item): using a mouse or using the touch screen.
• A Note identifies important information.

Table 1. Icons used in the help

Icon	Description
	This icon identifies important information
	This icon identifies conditions or practices that could result in loss of data.
	This icon identifies additional information that will help you use the application more efficiently.

Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on your application or oscilloscope. Contact Tektronix through mail, telephones, or the Web site. See Contacting Tektronix at the front of this document for contact information.

When you contact Tektronix Technical Support, please include the following information (be as specific as possible):

Windows 10 instruments need to have the User Account Control Settings set to Never Notify. To set User Account Control Settings:

1. Go to Control Panel > User Accounts > Change User Account Control settings.

2. Set the sliding control to Always notify as shown in the image, and click OK.

Use the following steps to install PCI Express software on any compatible instrument running Microsoft Windows 10 (64-bit). See Minimum System Requirements for details.

1. Close all applications (including the TekScope application).
2. Go to the www.tek.com Web site and search for TekExpress PCI Express to locate the installation file. Download the file TekExpress_PCIe_Deployment_Package.exe.
3. Copy or download the PCIe installer file to the oscilloscope.
4. Double-click the installer .exe file to extract the installation files and start the InstallShield Wizard. Follow the on-screen instructions. The software installs in the following locations:

   C:\Program Files\Tektronix\TekExpress\TekExpress PCI Express

5. The installer updates the TekScope Analyze menu to include the installed options.
   
   

Before you run tests for the first time, do the following:

1. Understand where your test files are stored on the instrument.
   After you install and start TekExpress PCIe, it creates the following folders on the oscilloscope:

   • \My Documents\My TekExpress\PCI Express
   • \My Documents\My TekExpress\PCI Express\Untitled Session

   Every time you start TekExpress PCIe, an Untitled Session folder is created in the PCIe folder. The Untitled Session folder is automatically deleted when you exit the PCIe application. To preserve your test session files, save the test setup before exiting the TekExpress application.

   CAUTION: Do not modify any of the session files or folders because this may result in loss of data or corrupted session files. Each session has multiple files associated with it. When you save a session, a .TekX file, and a folder named for the session that contains associated files, is created on the oscilloscope X: drive.

2. Map the shared My TekExpress folder as X: (X drive) on the instruments used in test setups running Microsoft Windows Operating System.

   The My TekExpress folder has the share name format <domain><user ID>My TekExpress. Or, if the instrument is not connected to a domain, the share name format is <instrument name><user ID>My TekExpress. This shared folder is used to save the waveform files and is used during other file transfer operations.

   Note:If the X: drive is mapped to any other shared folder, the application will display a warning message asking you to disconnect the X: drive manually.

3. Make sure that the My TekExpress folder (Drive X:) has read and write access:
   1. Right-click the folder and select Properties.
   2. Select the General tab and then click Advanced.
   3. In the Advanced Attributes dialog box, make sure that the option Encrypt contents to secure data is NOT selected (not checked).
      
      
4. See the prerun checklist before you run a test.

Set up tests using the tabs in the Setup panel. Settings in the DUT tab use a top-down, left-to-right logic flow, so that any parameter that affects or acts as a filter for other parameters appears either to the top of or to the left of the affected parameters.

Tests are saved when you save a test setup. To avoid overwriting test results, remember to assign a unique name to the test either before running it or immediately after.

Click the Setup > Test Selection > Schematic button to open a PDF file that shows the compliance test setup diagrams (instrument, DUT, and cabling) for supported testing configurations.

Test setup includes acquisition and configuration parameters. You can also select report options when setting up tests. Use the options in the Setup panel and Reports panel to select and configure tests.

1. Set up equipment.
2. Do the prerun checklist.
3. Set DUT parameters.
4. Select one or more tests.
5. Select acquisitions.
6. Configuration test parameters.
7. Set test measurement notification options.
8. Select report options.

After selecting and configuring tests, review the Prerun checklist and then click Start to run the tests. While tests are running, you cannot access the Setup or Reports panels. To monitor the test progress, switch back and forth between the Status panel and the Results panel.

The application displays a report when the tests are complete. While the tests are running, other applications may display windows in the background. The TekScope application takes precedence over other applications, but you can switch to other applications by using the Alt + Tab key combination. To keep the TekExpress PCIe application on top, select Keep On Top from the TekExpress Options menu.

To access the Options menu, click in the upper-right corner of the application. It has the following selections:

Use the TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. You can use the Search Criteria options to search the connected instruments depending on the connection type. The details of the connected instrument is displayed in the Retrieved Instruments window.

To access, click Options > Instrument Control Settings. Select USB and LAN as search criteria for TekExpress application and click Refresh. The connected instruments displayed in the Retrieved Instruments window and can be selected for use under Global Settings in the test configuration section.

Use the Email Settings utility to get notified by email when a measurement completes or produces any error condition. Follow the steps to configure email settings:

1. Select Options > Email Settings to open the Email Settings dialog box.

2. (Required) For Recipient email Address(es), enter one or more recipient email addresses. To include multiple addresses, separate the addresses with commas.

3. (Required) For Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name, followed by an underscore, followed by the instrument serial number, then the @ symbol, and the email server ID. For example: [email protected].

4. (Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client locations, and the SMTP Port number, in the corresponding fields.

   If this server requires password authentication, enter a valid login name, password, and host name in the corresponding fields.

   Note:If any of the above required fields are left blank, the settings will not be saved, and email notifications will not be sent.

5. In the Email Attachments section, select from the following options:

   • Reports: Select to receive the test report with the notification email.

   • Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you want to receive the full log or just the last 20 lines.

6. In the Email Configuration section:

   • Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is 0 MB.

   • Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a notification. The default is 1. You can also specify a timeout period.

7. Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email notifications.

8. To test your email settings, click Test Email.

9. To apply your settings, click Apply.

10. Click Close when finished.

Use the DUT tab to select parameters for the device under test. These settings are global and apply to all tests of current session. DUT settings also affect the list of available tests in the Test Selection tab.

Click Setup > DUT to access the DUT parameters:

Table 1. DUT tab configuration

Setting		Description
DUT ID		Adds an optional text label for the DUT to reports. The default value is DUT001.
Slot Number		The slot parameter (1, 2, 4, 8,16, or 32) of the DUT.
Comments icon (to the right of the DUT ID field)		Opens a Comments dialog box in which to enter optional text to add to a report. The maximum number of characters is 256. To enable or disable comments appearing on the test report, refer View a generated report.
Acquire live waveforms		Acquire active signals from the DUT for testing.
Use prerecorded waveform files		Run tests on a saved waveform. Load a saved test setup
Test Mode		Sets the overall testing mode. Select Compliance or User Defined: Compliance: Preselects tests and parameters to meet compliance specifications for the selected version, specification, and device type. User Defined: Enables the user to select specific tests and set custom parameters for tests. Note:Not applicable for the Device type / Specification type BaseSpec
Session		Allows you to save multiple config sessions and run multiple config/run sessions together.
Specification		PCIe supports the CEM, BaseSpec, RefClockSpec, U.2 (SFF-8639), and M.2 specification.
Device Type		Sets the DUT device type. The device type available depends on the selected specification. Following are the device types for each specifications CEM: Add-In-Card System-Board BaseSpec: TX Test Board SRIS TX Test Board RefClockSpec: Ref Clock U.2 (SFF-8639): Module Host M.2 M2_Add-In-Card M2_Host Note:CXL device type support is newly added to the TekExpress PCIe TX application. Refer CXL Support for more details.
Version		Sets the DUT generation version. Available versions are: CEM: Gen 1 (1.0a and 1.1), Gen2 (2.0), Gen3 (3.0), Gen4 (4.0) and Gen5 (5.0) Base Spec: Gen3 (3.0), Gen4 (4.0), Gen5 (5.0), and Gen6 (6.0) RefClockSpec: Gen5(5.0) Supports all Gen1-5 Versions U.2: Gen3 (3.0) M.2: Gen3 (3.0) CXL: Gen3 (3.0), Gen4 (4.0) and Gen5 (5.0)
Device Profile
Data Rates		Sets the data rates to test (2.5 Gb/s, 5 Gb/s, 8 Gb/s, 16 Gb/s, 32 Gb/s, and 64 Gb/s). The data rates available depend on the selected DUT version.
Filters		Opens the Filter Setup dialog box to select custom filter files with which to perform link analysis on the source waveforms.
Presets		Note:This settings is only available for Gen2, Gen3, Gen4, and Gen5 DUT versions. Opens the Presets dialog box. User can select Gen2 preemphasis and Gen3 to Gen5 presets(P0 to P10) for signal quality tests in respective tabs. All preemphasis and presets are selected by default. At least one preemphasis level/preset must be selected for each generation.
Swings and Crosstalks	Voltage Swing Limits	Sets the lane/link transmitter p-p voltage swing. This affects the limits applied to certain measurements based on the settings and does not change anything on the DUT tab.
	Crosstalk Limits	Sets specific eye test limits depending on if the DUT design uses interleaved or non interleaved routing. This affects the limits applied to certain measurements based on the settings and does not change anything on the DUT tab. This is applicable for Gen2. When the DUT uses noninterleaved routing, select Crosstalk (noninterleaved routing). When the DUT uses interleaved routing, select No Crosstalk (interleaved routing).
SSC (Spread Spectrum Clocking)		Enables or disables SSC clocking. This affects the limits applied to certain measurements based on the settings and does not change anything on the DUT tab.
Lanes		Opens the Test Lane Setup dialog box to select the lanes to test. Lanes required for compliance testing are colored orange. At least one lane must be selected. The Link Width setting determines the number of lanes that can be tested.
Automated DUT Control		Enables automatic toggling of the DUT into different test modes (generation/equalization). Requires the use of an AFG or AWG or NI USB toggle tool. Click Setup to access the Automated DUT control setup
Use Switch Matrix		Select to use the switch matrix. This solution allows you to map each of the several transmitter signals and forward the selected input either to another relay or to the oscilloscope channel. Click Setup to configure the switch matrix. Refer Switch Matrix application for more details on configurations. Note: Keithley supports maximum of 12 lanes and Gigatronics supports maximum of 16 lanes. Switch Matrix is applicable for Gen1, 2, 3 only.
Signal validation	Signal validation	Sets the application to validate acquisition signals and perform the specified action to take when acquired signals do not meet requirements. Select the action from the list.
	Perform Pattern Decoding	Select to validate the pattern according to the respective lane and preset for Gen3.
Deskew/Attenuation		Provides the option of setting deskew and attenuation values on the scope either in an automated way or manual way. Refer Deskew and Attenuation for more details.
Test Type		Use this procedure to choose between CEM or Base type of Ref Clock testing. Note:This is only available for Ref Clock testing and the measurement limits will be changed based on this setting.

Use the Test Selection tab to select the tests. The test measurements available depends on the settings selected in the DUT tab.

Use the Acquisition tab in the Setup panel to view and select test acquisition parameters, including the signal source channels, acquisition options, and waveform save options. This panel also shows the signal inputs required for the selected DUT parameters.

Contents displayed on this tab depend on whether you acquire active waveforms or use prerecorded waveform files (as set in the DUT tab. Contents displayed on this tab also depend on detected probes and the specified DUT type.

Active waveforms

Table 1. Acquisitions tab configuration

Setting	Description
Source Selection	Click the Source fields to select signal sources for the listed lanes. The number of lanes shown depends on the parameters set in the DUT tab.
Refresh Sources	Click Refresh Sources to refresh the probe configuration after changing any probes. (This button performs the same function as the Refresh button in the Probe Configuration dialog box.)
View Probes	Click View Probes to view the detected probe configuration. Use the View Probes dialog box to enable or disable probe signal source access in the application. Note:Only Differential option is available under Probe Method for Trimode probes.
Acquire Options	Click the Acquire Options controls to set how the application acquires and analyzes signals.
Save Options	Click the Save Options field to set how the application saves acquired waveforms (save all waveforms, save all waveforms after applying filters, or discard all waveforms after running analysis).
No. of Acquisitions	Select the No. of acquisition for Gen4 from the drop-down.

Prerecorded waveforms

When using prerecorded waveform files, this panel lists available prerecorded waveform files. You can only select the source of the prerecorded waveform file for each test. See Set acquisition waveform source for prerecorded waveform files.

Use Configuration tab to view and configure the Global Settings and the measurement configurations. The measurement specific configurations available in this tab depends on the selections made in the DUT panel and Test Selection panel.

Table 2. Configuration tab: Global Settings configuration

Setting	Description
Test Mode	Determines whether test parameters are in compliance or can be edited (User Defined Mode). Compliance: Most test parameter values cannot be edited. User Defined: Enables editing of most test parameters. Note:Not applicable for the Device type / Specification type BaseSpec
Instruments Detected	Displays a list of the connected instruments found during the instrument discovery. Instrument types include equipment such as oscilloscopes and signal generators.
Instrument Control	Click Settings to search for connected instruments and view instrument connection details. Connected instruments displayed in TekExpress instrument control settings and can be selected for use under Global Settings in the test configuration section.
Manual Toggle	Click Setup to manually toggle AWG or AFG. This is enabled when the Signal Source for DUT Automation in Instruments Detected is selected.
Automated DUT Control	Enables automatic toggling of test patterns for DUT tests. Requires an AWG or AFG as part of the test setup. Click Setup to configure the DUT automation settings.
Record Length, Sample Rate, Bandwidth	These settings apply to all tests selected for the indicated data rate. Record Length: Specifies the waveform record length. Sample Rate: Specifies the oscilloscope sample rate to use for all tests. Bandwidth: Specifies the oscilloscope bandwidth to use for all tests.
Sig Validation Threshold	Sets the threshold voltage to use for signal validation.
Trigger Type (Gen3/Gen4/Gen5)	Edge Width Auto Note:When auto is selected, width trigger type is applied. If it fails, edge trigger type is applied.
CTLE	This configuration setting allows the user to configure for CTLE optimization for Gen6 jitter measurements. Refer CTLE optimization feature for more details.
Scope Noise	This configuration setting allows the user to apply scope noise compensation for CTLE optimization and measurement analysis for Gen6 data rate test. Refer Scope Noise Characterization for more details.
SigTest Configuration	Click Setup; select the executable (.exe) for Gen1, 2, 3, 4, and 5 and template configuration for signal quality and preset tests for the data rates selected. Check/Un-check Silent mode to run sigtest in Silent mode/non-silent mode.
Analysis tool (For RfClockSpec Only)	Intel CJT Skyworks Clock Jitter Tool DPOJET

Use Preferences tab to set the application action on completion of a measurement. The Preferences tab has the feature to enable or disable certain options related to the measurement execution.

Refer the below table for the options available in the Preferences tab:

The tests are grouped and displayed based on the Clock and Data lane. It displays the tests along with the acquisition type, acquire, and analysis status of the tests. In pre-recorded mode, Acquire Status is not valid.

The Test Status tab presents a collapsible table with information about each test as it is running. Use the symbols to expand () and collapse () the table rows.

The Test Status tab displays the detailed execution status of the tests. Also, displays each and every execution step in detail with its timestamp information. The log details can be used to troubleshoot and resolve any issue/bug which is blocking the test execution process.

The Configuration tab describes the report generation settings to configure the Reports panel. Select report settings before running a test or when creating and saving test setups. Report settings configured are included in saved test setups.

Table 1. Report configuration panel settings

Control	Description
View	Click to view the most current report.
Generate	Generates a new report based on the current analysis results.
Report Update Mode Settings
Generate new report	Each time when you click Run and when the test execution is complete, it will create a new report. The report can be in either .mht, .pdf, or .csv file formats.
Append with previous run session	Appends the latest test results to the end of the current test results report. Each time when you click this option and run the tests, it will run the previously failed tests and replace the failed test result with the new pass test result in the same report.
Include header in appended reports	Select to include header in appended reports.
Replace current test results	Replaces the previous test results with the latest test results. Results from newly added tests are appended to the end of the report.
In previous run, current session	Select to replace current test results in the report with the test result(s) of previous run in the current session.
In any run, any session	Select to replace current test results in the report with the test result(s) in the selected run session’s report. Click and select test result of any other run session.
Report Creation Settings
Report name	Displays the name and path of the <Application Name> report. The default locations is at \My Documents>\My TekExpress\<Application Name>\Reports. The report file in this folder gets overwritten each time you run a test unless you specify a unique name or select to auto increment the report name. To change the report name or locations, do one of the following: In the Report Path field, type the current folder path and name. Double-click in the Report Path field and then make selections from the popup keyboard and click Enter. Be sure to include the entire folder path, the file name, and the file extension. For example: C:\Documents and Settings\your user name\My Documents\My TekExpress\<Application Name> \DUT001.mht. Note:You cannot set the file locations using the Browse button. Open an existing report Click Browse, locate and select the report file and then click View at the bottom of the panel.
Save as type	Saves a report in the specified file type, selected from the drop-down list. The report is saved in .csv, .pdf, or .mht. Note: If you select a file type different from the default, be sure to change the report file name extension in the Report Name field to match.
Auto increment report name if duplicate	Sets the application to automatically increment the name of the report file if the application finds a file with the same name as the one being generated. For example: DUT001, DUT002, DUT003. This option is enabled by default.
View report after generating	Automatically opens the report in a Web browser when the test execution is complete. This option is selected by default.
Report Customization Settings
Create CXL Report	Creates CXL device type for AIC/SYB of CEM Spec and Tx Test Board/SRIS Test Board of BaseSpec. Note:This option is unselected by default.

The View Settings tab describes the report view settings to configure the Reports panel. Select report view settings before running a test or when creating and saving test setups. Report settings configured are included in saved test setups.

Sample report and its contents

A report shows detailed results and plots, as set in the Reports panel.

Setup Information

The summary box at the beginning of the report lists setup configuration information. This information includes the oscilloscope model and serial number, optical module model and serial number, and software version numbers of all associated applications.

Test Name Summary Table

The test summary table lists all the tests which are executed with its result status.

Measurement

The measurement table displays the measurement related details with its parameter value.

User comments

If you had selected to include comments in the test report, any comments you added in the DUT tab are shown at the top of the report.

Generation Pass/Fail Table

The Generation Pass/Fail Table shows the pass/fail result of each individual generation. This table is shown only when the results are grouped by Test Name.

You can save the test setup and recall it later for further analysis. Saved setup includes the selected oscilloscope, general parameters, acquisition parameters, measurement limits, waveforms (if applicable), and other configuration settings. The setup files are saved under the setup name at X:\TekExpress PCI Express

Note:Images that are shown in this Saving and recalling test setup chapter are for illustration purpose only and it may vary depending on the TekExpress application.

You can save a test setup before or after running a test. You can create a test setup from already created test setup or using a default test setup. When you save a setup, all the parameters, measurement limits, waveform files (if applicable), test selections, and other configuration settings are saved under the setup name. When you select the default test setup, the parameters are set to the application’s default value.

• Select Options > Save Test Setup to save the opened setup.
  
  
  
  
• Select Options > Save Test Setup As to save the setup with different name.
  
  
  
  

To open (load) a saved test setup, do the following:

• Select Options > Open Test Setup.
  
  
  
  
• From the File Open menu, select the setup file name from the list and click Open.
  
  
  
  

Note:Parameters that are set for the respective test setup will enable after opening the file.

Switch Matrix application allows to configure and setup automated multi-lane testing using RF switch. The solution allows you to map each of the several transmitter signals and forward the selected input either to another relay or to the oscilloscope channel.

This section describes the steps to configure the TCPIP socket configuration in your script execution device and the steps to configure the TekVISA configuration in the oscilloscope to execute the SCPI commands.

This command sets or queries the device name of the application.

This command sets or queries the suite name of the application.

This command selects or deselects the specified test name of the application.

This command sets or queries the version name of the application.

This command sets or queries the general parameter values of the application.

This command queries the list of available devices on the DUT panel as comma separated values.

This command queries the list of available suites for the selected device as comma separated values.

This command queries the list of available tests of the application for the selected device as comma separated values.

This command queries the list of available version names of the application for the selected device as comma separated values.

This command queries the list of available instruments based on the specified instrument type.

This command sets or queries the IP address of the instrument based on the specified instrument type.

This command queries the information of the generated report file in the format "<FileSize>","<FileName>".

This command queries the information of the generated waveform files in the format.

<File1Size,"File1Name”>.

If there are more than one waveform, the waveform file names are displayed with the comma separated values in the format

<File1Size,"File1Name">,<File2Size,"File2Name">.

This command queries the information of the generated image files in the format.

<File1Size,"File1Name”>.

If there are more than one image, the image file names are displayed with the comma separated values in the format

<File1Size,"File1Name">,<File2Size,"File2Name">.

This command queries the active TekExpress application name running on the oscilloscope.

This command sets or queries the DUTID of the application.

This command sets or queries the acquire mode status.

This command sets or queries the execution mode status.

This command generates the report for the current session.

This command queries the value of specified report header field in the report.

Command arguments

Argument Name	Argument Type
<Device Field> Device field is the header name of each field in the setup information section of the report.	<String>

This command queries the value of specified result detail available in report summary/details table.

This command restores the setup to default settings.

This command saves the setup.

This command saves the settings to a specified session.

This command opens the setup from a specified session.

This command queries the current setup file name.

This command run/stop/pause/resume the selected measurements execution in the application.

This command queries the current measurement execution status.

This command queries whether the current setup is saved or not saved.

This command queries whether the previous command execution is completed successfully.

This command queries the last error occurred.

This command sets or queries the popup details.

This command sets or queries the limit values in the limits editor window.

This command set or queries the waveform file recalled for the specified test name and acquire type.

If there are more than one waveform, the waveform file names are displayed with the symbol "$" separated values in the format

<WaveformFileName1$ WaveformFileName2>.

This command sets or queries the enable/disable status of Verbose function.

This command sets or queries the enable/disable status of the View report after generating function.

This command returns the report as XML string.

This command copies all the images from current run session to the given destination locations.

This command selects the specified test(s) and deselect all other tests.

This command returns the complete information about the selected test.

The information includes application name, TestID, Device selected, Suite selected, version, Test name, Test description.

Sets the application configurations to default value.

Enter the name to save/config the session.

Load the selected config/run session.

Deletes the selected config/run session.

Run the selected config/run session.

Returns the list of available config/run session.

Returns the selected config/run session.

Overrides the selected config/run session.

The command exits or close the application

import sys

from time import sleep

import platform

import os

import traceback

import socket_instrument

import csv

_dutId = 'Test DUTID'

_deviceName = "CEM"

_suiteName = "Add-In-Card"

_versionName = "Gen1 - 1.1"

[_param, _value] = ['Signal Validation', 'Turn Off Signal Check']

_measList = ['Unit Interval Gen1']

#No need to change the IP address as it is running on same machine

ipadsdress = "localhost"

si = socket_instrument.SocketInstrument(ipadsdress, 5000)

print si.instId

# Set DUTID

si.write('TEKEXP:VALUE DUTID,"{0!s}"'.format(_dutId))

print si.query('TEKEXP:VALUE? DUTID')

# Set device

si.write('TEKEXP:SELECT DEVICE,"{0!s}"'.format(_deviceName))

while si.query('TEKEXP:SELECT? DEVICE') != '"{}"'.format(_deviceName):

sleep(1)

print si.query('TEKEXP:SELECT? DEVICE')

# Set test suite

si.write('TEKEXP:SELECT SUITE,"{0!s}"'.format(_suiteName))

while si.query('TEKEXP:SELECT? SUITE') != '"{}"'.format(_suiteName):

sleep(1)

print si.query('TEKEXP:SELECT? SUITE')

# Set test version

si.write('TEKEXP:SELECT VERSION,"{0!s}"'.format(_versionName))

while si.query('TEKEXP:SELECT? VERSION') != '"{}"'.format(_versionName):

sleep(1)

print si.query('TEKEXP:SELECT? VERSION')

# Set Signal Validation to 'Turn Off'

si.write('TEKEXP:VALUE GENERAL,"{0!s}","{1!s}"'.format(_param, _value))

print si.query('TEKEXP:VALUE? GENERAL,"{0!s}"'.format(_param))

# Assign Test name

si.write('TEKEXP:SELECT TEST,ALL,FALSE')

sleep(2)

for _meas in _measList:

si.write('TEKEXP:SELECT TEST,"{0!s}",TRUE'.format(_meas))

sleep(2)

selectedMeasurements = si.query('TEKEXP:SELECT? TEST')

selectedMeasurements = selectedMeasurements.replace('"','').split(',')

#print 'Selected Measurements'

#for meas in selectedMeasurements:

#print meas

# if any General Parameters User want to modify can be done here

# Execution Starts

"""Execution function with popup handling"""

appStatus = si.query('TEKEXP:STATE?')

if appStatus == 'READY':

si.write('TEKEXP:STATE RUN')

while str(si.query('TEKEXP:STATE?')) != 'RUNNING':

sleep(1)

appStatus = si.query('TEKEXP:STATE?')

try:

while str(appStatus) != 'READY':

appStatus = si.query('TEKEXP:STATE?')

if appStatus in ['RUNNING']:

sleep(2)

print('Application Status: ..{}..'.format(appStatus))

if appStatus in ['WAIT','ERROR']:

print('\n----------------------------------------')

print('Application Status: {} Message'.format(appStatus))

info = str(si.query('TEKEXP:POPUP?'))

[Title, Message, Responses] = info.split(';')

ResponseOptions = str(Responses[12:-1]).strip('"')

ResponseOptions = ResponseOptions.split(',')

print('\n\n'+Title+'\n\n'+Message+'\n')

print("----------------------------------------")

for res in ResponseOptions:

print str(ResponseOptions.index(res)) + ' > ' + res

userResponse = int(input('Choose your option: '))

si.write('TEKEXP:POPUP "{0!s}"'.format(ResponseOptions[userResponse]))

print('\nResponse Sent: "{0!s}"'.format(ResponseOptions[userResponse]))

print("----------------------------------------")

print("***** EXECUTION COMPLETED *****")

except Exception:

print("Exception Occured")

# Get the Measurement Results

allDetailsList = list()

allValuesList = list()

allMarginList = list()

for meas in _measList:#selectedMeasurements:

allDetailsList = (si.query('TEKEXP:RESULT? "{0!s}","{1!s}"'.format(meas,'Details'))).replace('"','').split(',')

allValuesList = (si.query('TEKEXP:RESULT? "{0!s}","{1!s}"'.format(meas,'Value'))).replace('"','').split(',')

allMarginList = (si.query('TEKEXP:RESULT? "{0!s}","{1!s}"'.format(meas,'Margin'))).replace('"','').split(',')

results = zip(allDetailsList, allValuesList, allMarginList)

# Define local variables

testResultList = list()

details = list()

values = list()

margines = list()

# Header Info for the CSV file

header1CSV=["Detail"]

header2CSV=["Value"]

header3CSV=["Margin"]

header=zip(header1CSV,header2CSV,header3CSV)

testResultList.append(header)

# Convertion to suitable for CSV formatting

testResultList.append(results)

# Open a CSV file object

csvFilePath = "C:\\Test_PCI_Results.csv"

csvFilObj = open(csvFilePath,"wb")

# writing CSV file with the statistical values

mywritter=csv.writer(csvFilObj)

for rowVal in testResultList:

mywritter.writerows(rowVal)

# Closing the CSV file object

csvFilObj.close()

si.disconnect()

You can find the application files at C:\Program Files\Tektronix\TekExpress PCI Express. The application directory and associated files are organized as follows:

The TekExpress PCIe application uses the following file name extensions:

Files related to tests are stored in the My TekExpress\PCI Express folder. Each test setup in this folder has a test setup file and a test setup folder, both with the test setup name.

The test setup file is preceded by the TekExpress icon and usually has no visible file name extension.

Inside the test setup folder is another folder named for the DUT ID used in the test sessions. The default is DUT001.

Inside the DUT001 folder are the session folders and files. Each session also has a folder and file pair, both named for the test session using the naming convention (date)_(time). Each session file is stored outside its matching session folder:

Each session folder contains image files of any plots generated from running the test session. If you selected to save all waveforms or ran tests using prerecorded waveform files, these are included here.

The first time you run a new, unsaved session, the session files are stored in the Untitled Session folder located at ..\My TekExpress\PCI Express. When you name and save the session, the files are placed in a folder with the name that you specify. A copy of the test files stay in the Untitled Session folder until you run a new test or until you close the PCIe application.

TekExpress PCIe provides an option to de-embed the signal path using filter files. You create the filter files. The filter files are .flt files composed of de-embed filter coefficients for a particular sampling rate. A filter file created for one sampling rate might not work for other sampling rates, so it is important to understand at what sampling rate the measurements are being performed.

Also, the de-embedding filters might differ based on the type of input. For example, if a single ended input is made using a matched SMA cable pair, a filter file for de-embedding a single SMA cable must be provided, since matched SMA cables mostly have similar s-parameters. So in this case, the same filter file is used to de-embed the SMA cable pair.

The maximum sampling rate provided on any channel combination on MSO/DPO/DSA70000/C/D/DX series oscilloscopes is 50 GS/s in realtime mode. The maximum sampling rate provided on Ch1-Ch3 and Ch2-Ch4 channel combinations on MSO/DPO/DSA70000C/D/DX/SX series oscilloscopes is 100 GS/s, provided only 2 channels are on at a given time.

TekExpress PCI Express package contains setup files (*.TekX) which can be used at PCI-SIG workshop for compliance tests.

How to open a setup file

1. Click Options > Open Test Setup
2. Select the TekExpress Setup File as per your required configuration. Check Setup files configuration details table for configuration details.
   
   
3. Make the configuration details and start the test execution.
4. Click Save Test Setup As and save the setup.

   Note:You cannot edit the TekExpress Test Setup files as they are in Read Only mode.

Note:The setup files path is C:\Program Files\Tektronix\TekExpress\TekExpress PCI Express\Setup Files

This document describes the procedure to run PCIe Base Spec Gen4/Gen5 SRIS Tx Test Board tests using TekExpress PCI Express.

Accessories required

• Gen4/Gen5 Base specification fixture
• SMA-SMP cables
• TCA-SMA 292D / TriMode probes
• AWG7002A or AWG7001A

Capture data signals at sampling rate of 100Gsps/200Gsps with 12.5 M record length. Ensure the PCIE_TX_Toggle_Patterns_v10.0.0.2.exe is installed on AWG-70K series and the recommended probes and real time oscilloscopes are used.

1. In DUT panel, select Specification as BaseSpec and Device Type as SRIS Tx Test Board.
   
2. If AWG70K is detected then the AWG Clock Setup check box will be enabled in the configuration panel. Click the Setup button next to AWG Clock Setup check box. This will bring up the SRIS configuration, with a selection to choose SSC on/Off.
   
3. Based on the selections of the AWG Clock Setup check box, SSC on/Off selection and different combinations of AWG setup files will be loaded on the AWG. These combinations dictate if an external 100 MHz reference clock (with SSC on/Off) on Ch1 of the AWG will be transmitted. The following AWG files loaded as per configuration for Base specification (Device) and DUT Type SRIS Tx Test Board (Suite) for Gen4 and Gen5.
   
   
4. Click Start and when the application prompts, power on the Gen4/Gen5 DUT. Ensure that the DUT transmits Gen4/Gen5 selected presets. Analysis will be done with SigTest.