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Programming and Erasing Flash Memory Devices Using the Keithley S530 Pulse Generator Option


This note provides an overview of how to use the S530 Parametric Test System’s pulse source option to program and erase NAND flash memory cells. For further information on these measurements and on the S530 Parametric Test System pulse option, consult the user documentation provided with the test system or contact a local Keithley applications engineer.
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